AI holds great promise for our industry. It will help close the divide between design, manufacturing and test that is ...

A new technical paper titled “Design Decoupling of Inner-and Outer-Gate Lengths in Nanosheet FETs for Ultimate Scaling” was ...

proteanTecs AVS Pro has demonstrated the potential to extend chip lifespans by up to 18%. In data centers, this translates to ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of ...

Increase yield and improve quality by integrating data sources across the entire IC manufacturing supply chain.

ML-powered outlier detection for semiconductor defects and real-time monitoring for in-field predictive and prescriptive ...